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AENOR Norma

IEEE 300-1988

Título:
IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
Scope:

Revision Standard - Active.
This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators)which may not be readily available. Test procedures for the associated amplifiers and preamplifiers are described in ANSI/IEEE Std 301-1988

Keywords:

IEEE Std 300-1988 Revision of ANSI/IEEE Std 300-1982 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

144,27
Idioma Formato

Formato físico y digital

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