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Normas IEEE americanas electrotécnicas - AENOR

IEEE/IEC 62527-2007

Fecha:
2007-12-09 /Active
Título:
IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
Scope:

New IEEE Standard - Active.
This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

Keywords:

: automated test equipment (ATE); comparator; DC levels; device power supply (DPS); device under test (DUT); driver; driver termination; dynamic load; functional test; parametric measurement unit (PMU); power sequence; slew rate; voltage clamp

152,1
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Formato físico y digital

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