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Normas IEEE americanas electrotécnicas - AENOR

IEEE 1500-2005

Fecha:
2011-03-31 /Active
Título:
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
Scope:

New IEEE Standard - Active.
This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.

Keywords:

core test; embedded core test; IP test; test reuse

126,04
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Formato físico y digital

Nota: Precios sin IVA ni gastos de envío

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