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Normas IEC internacionales electrotécnicas - AENOR
IEC 62528:2007

IEC 62528:2007

Standard Testability Method for Embedded Core-based Integrated Circuits

Fecha:
2007-11-07 /Vigente
Resumen (inglés):
Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.
Resumen (francés):
314,44
Idioma Formato

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