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Normas IEC internacionales electrotécnicas - AENOR
IEC 60747-18-1:2019

IEC 60747-18-1:2019

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

Fecha:
2019-05-20 /Vigente
Resumen (inglés):
IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
Resumen (francés):
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