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Normas IEC internacionales electrotécnicas - AENOR
IEC PAS 62396-2:2007

IEC PAS 62396-2:2007

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

2007-09-18 /Anulada
Resumen (inglés):
Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
Resumen (francés):
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