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Normas IEC internacionales electrotécnicas - AENOR
IEC PAS 62171:2000

IEC PAS 62171:2000

Guidelines for particle impact noise detection (PIND) testing, operator training and certification

Fecha:
2000-08-22 /Anulada
Resumen (inglés):
Aims at disseminating and sharing the relevant information on PIND testing to all interested parties. The concepts and materials presented here primarily deal with most of the cause factors that affect the "Measurement Variability" pertinent to PIND and how to control them.
Resumen (francés):
228,57
Idioma Formato

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