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Normas IEC internacionales electrotécnicas - AENOR
IEC PAS 62161:2000

IEC PAS 62161:2000

Steady state temperature humidity bias life test

Fecha:
2000-08-22 /Anulada
Resumen (inglés):
Aims at evaluating the reliability of nonhermetic packaged solid-state devices in humid environments. Employs conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
Resumen (francés):
18,64
Idioma Formato

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