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Normas IEC internacionales electrotécnicas - AENOR
IEC TS 62396-5:2008

IEC TS 62396-5:2008

Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems

Fecha:
2008-08-19 /Anulada
Resumen (inglés):
IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).
Resumen (francés):
96,25
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