Saltar navegación principal
Normas IEC internacionales electrotécnicas - AENOR
IEC 61000-4-11:1994+AMD1:2000 CSV

IEC 61000-4-11:1994+AMD1:2000 CSV

Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

Compatibilité électromagnétique (CEM) - Partie 4-11: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension

Fecha:
2001-03-28 /Anulada
Resumen (inglés):
This standard defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low voltage power supply networks for voltages dips, short interruptions, and voltage variations. It applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase. It does not apply to electrical and electronic equipment for connection to d.c. networks or 400 Hz a.c. networks.
Resumen (francés):
This standard defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low voltage power supply networks for voltages dips, short interruptions, and voltage variations. It applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase. It does not apply to electrical and electronic equipment for connection to d.c. networks or 400 Hz a.c. networks.
Relaciones con otras normas IEC
196,32
Idioma Formato

Nota: Precios sin IVA ni gastos de envío

Añadir a la cesta