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Normas DIN – AENOR
DIN IEC 62373:2004-09

DIN IEC 62373:2004-09

Bias-Temperature Stability Test for MOSFET (IEC 47/1763/CD:2004)

Stabilität von MOSFET unter Temperatur-Spannungs-Beanspruchung (IEC 47/1763/CD:2004)

Fecha Anulación:
2017-01 /Withdrawn
Equivalencias internacionales:

IEC 47/1763/CD (2004)

Relación con otras normas DIN:

Reemplazada por: DIN EN 62373:2007-01

Resumen:
This standard provides the test procedure for bias-temperature stability (BT test) of MOSFETs.
In dieser Norm ist das Prüfverfahren zur Temperatur-Spannungs-Stabilität (BT-Test) von MOSFET-Bauelementen festgelegt.
Keywords:
Components, Definitions, Electrical engineering, Electronic engineering, Electronic equipment and components, Field-effect transistors, Limits (mathematics), Measuring equipment, MOSFET, Ratings, Semiconductor devices, Stability, Temperature stress, Testing, Testing devices, Thermal stress, Transistors
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