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Normas DIN – AENOR
DIN IEC 60748-4-3:2003-09

DIN IEC 60748-4-3:2003-09

Semiconductors devices - Integrated circuits - Part 4-3: Interface integrated circuits; Dynamic criteria for Analogue-Digital Converters (ADC) (IEC 47A/667/CD:2003)

Halbleiterbauelemente - Integrierte Schaltungen - Teil 4-3: Integrierte Interfaceschaltungen; Dynamische Merkmale für Analog-Digital-Konverter (ADC) (IEC 47A/667/CD:2003)

Fecha Anulación:
2017-02 /Withdrawn
Equivalencias internacionales:

IEC 47A/667/CD (2003)

Resumen:
This international standard specifies a set of measuring methods and specifications for testing ADCs under dynamic conditions, together with associated terminology and characteristics.
In dieser internationalen Norm sind für das Messen von ADC unter dynamischen Verhältnissen eine Reihe von Messverfahren und Messbedingungen zusammen mit der entsprechenden Terminologie und Merkmalen festgelegt.
Keywords:
Analogue, Analogue integrated circuits, Analogue-digital convertors, Definitions, Digital integrated circuits, Electrical engineering, Electrical measurement, Electrical testing, Electronic engineering, Electronic equipment and components, Integrated circuit technology, Integrated circuits, Interface circuits, Life (durability), Limits (mathematics), Measuring techniques, Microprocessors, Operating conditions, Ratings, Read-only storage, Reliability, Semiconductor devices, Semiconductors, Specification (approval), Storage circuits, Symbols, Technical data sheets, Testing
93,27
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Formato digital

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