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Normas DIN – AENOR
DIN IEC 47E/37/CDV:2000-04

DIN IEC 47E/37/CDV:2000-04

Amendment to IEC 60747-8: Field-effect transistors (IEC 47E/37/CDV:1996)

Amendement à la CEI 60747-8: Transistors à effect de champ (CEI 47E/37/CDV:1996)

Änderung zu IEC 60747-8: Feldeffekttransistoren (IEC 47E/37/CDV:1996)

Fecha Anulación:
2016-03 /Withdrawn
Equivalencias internacionales:

IEC 47E/37/CDV (1996-01)

Relación con otras normas DIN:
Resumen:
The document modifies chapter II: Terminology and letter symbols, chapter III, essential ratings characteristics and chapter IV: Measuring method of IEC 60747-8.
Das Dokument enthält Änderungen zu Kapitel II: Begriffe und Kurzzeichen, Kapitel III, wesentliche Grenz- und Kennwerte und zu Kapitel IV: Meßverfahren der IEC 60747-8.
Keywords:
Barrier layers, Components, Definitions, Discrete devices, Drain current, Electrical engineering, Electronic engineering, Electronic equipment and components, Field-effect transistors, Gates, Inspection, Insulating layers, Integrated circuits, Limits (mathematics), Marking, Measurement, Measuring techniques, Ratings, Semiconductor devices, Semiconductors, Specification (approval), Symbols, Transistors
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