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Normas DIN – AENOR
DIN EN 13477-2:2019-10

DIN EN 13477-2:2019-10

Non-destructive testing - Acoustic emission testing - Equipment characterisation - Part 2: Verification of operating characteristics; German and English version prEN 13477-2:2019 / Note: Date of issue 2019-09-06*Intended as replacement for DIN EN 13477-2 (2013-04).

Essais non destructifs - Émission acoustique - Caractérisation de l'équipement - Partie 2: Vérifications des caractéristiques de fonctionnement; Version allemande et anglaise prEN 13477-2:2019 / Attention: Date de parution 2019-09-06*Prévu pour remplacer DIN EN 13477-2 (2013-04).

Zerstörungsfreie Prüfung - Schallemissionsprüfung - Charakterisierung der Prüfausrüstung - Teil 2: Überprüfung der Betriebskenngrößen; Deutsche und Englische Fassung prEN 13477-2:2019 / Achtung: Erscheinungsdatum 2019-09-06*Vorgesehen als Ersatz für DIN EN 13477-2 (2013-04).

Fecha:
2019-10 /Active
Equivalencias internacionales:

prEN 13477-2 (2019-09)

Resumen:
This part of the standard specifies methods for routine verification of the performance of AE equipment comprising one or more sensing channels. It is intended for use by operators of the equipment under laboratory conditions. Verification of the measurement characteristics is recommended after purchase of equipment, modifications, use under extraordinary conditions, or if one suspects a malfunction. The procedures described in this European Standard do not exclude other qualified methods, e. g. verification in the frequency domain.
Keywords:
Acoustic emission testing, Analysis, Cables, Characterisations, Course of test, Current noise, Definitions, Documentation of devices, Equipment, Examination (quality assurance), Frequencies, Functions, Materials testing, Measurement, Measuring instruments, Measuring systems, Measuring techniques, Non-destructive testing, Parameters, Performance tests, Piezoelectric, Preamplifiers, Properties, Recording, Results, Sensitivity, Sensors, Shields, Signals, Sound propagation, Sound transmission, Testing, Testing conditions, Testing devices, Transient, Waveforms
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