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Normas DIN – AENOR
DIN SPEC 52407:2015-03

DIN SPEC 52407:2015-03

Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Nanotechnologies - Méthodes de préparation et evaluation pour mesurages des particles avec AFM et TSEM

Nanotechnologien - Methoden zur Präparation und Auswertung für Partikelmessungen mit Rasterkraftmikroskopie (AFM) und Rasterelektronenmikroskopie im Transmissionsmodus (TSEM)

Fecha:
2015-03 /Active
Resumen:
This DIN SPEC describes different methods for preparation, measurement and interpretation which allow for reliable determinations of the particle size of close distributed reference nanoparticles in suspensions and aerosols with AFM and TSEM.
Keywords:
Definitions, Electrical engineering, Equipment, Grid systems, Interpretations, Measurement, Measuring instruments, Measuring techniques, Methods, Metrology, Microscopy, Nanotechnology, Particulate matter measurement, Preparing, Scanning electron microscopes, Separation, Size measurement, Transmittances, Wear-quantity
57,76
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