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Normas DIN – AENOR
DIN IEC 47E(Sec)5:1994-04

DIN IEC 47E(Sec)5:1994-04

Semiconductor devices; supplement to IEC 60747-7: bipolar transistors, pulse methods for collector-base cutt-off current and emitter-base cutt-off current (IEC 47E(Secretariat)5:1993)

Halbleiterbauelemente; Ergänzung zu IEC 60747-7: Bipolare Transistoren, Impulsmeßverfahren für den Kollektor-Basis- und Ermitter-Basis-Sperrstrom (IEC 47E(Sec)5:1993)

Fecha Anulación:
2010-04 /Withdrawn
Equivalencias internacionales:

IEC 47E(Secretariat)5 (1993)

Relación con otras normas DIN:

Reemplazada por: DIN IEC 47E/36A/CDV:2000-04

Resumen:
This document deals with additional measuring methods for bipolar transistors to be introduced in IEC 747-7.
Das Dokument enthält zusätzliche Meßverfahren für bipolare Transistoren zur Aufnahme in IEC 747-7.
Keywords:
Bipolar transistors, Components, Electrical engineering, Electronic engineering, Electronic equipment and components, Inverse current, Measurement, Measuring techniques, Momentum, Semiconductor devices, Semiconductors, Transistors
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