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Normas DIN – AENOR
DIN IEC 47(CO)1261:1992-08

DIN IEC 47(CO)1261:1992-08

Semiconductor devices; measuring methods for GaAs field-effect transistors used in microwave applications; identical with IEC 47(Central office)1261

Halbleiterbauelemente - Messverfahren für GaAs Feldeffektransistoren für Mikrowellenanwendungen; Identisch mit IEC 47(CO)1261

Fecha Anulación:
2011-01 /Withdrawn
Equivalencias internacionales:

IEC 47(CO)1261 (1990)

Resumen:
The document describes measuring methods for GaAs FET for microwave applications to be introducted in IEC 747-8.
Das Dokument beschreibt Meßverfahren für GaAs FET für Mikrowellenanwendungen zur Ergänzung der IEC 747-8.
Keywords:
Components, Electrical engineering, Electronic engineering, Electronic equipment and components, Field-effect transistors, Input power, Measurement, Measuring techniques, Microwaves, Power output, Semiconductor devices, Testing, Transistors
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