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DIN IEC 47(Sec)1234:1992-04

DIN IEC 47(Sec)1234:1992-04

Semiconductor devices; destructive test; term and definition; identical with IEC 47(Secretariat)1234

Halbleiterbauelemente - Zerstörende Prüfung - Begriff; Identisch mit IEC 47(Sec)1234

Fecha Anulación:
2010-12 /Withdrawn
ICS:

31.080.01 - Semiconductor devices in general

Equivalencias internacionales:

IEC 47(Secretariat)1234 (1991)

Resumen:
The draft standard contains a definition for the term "destructive test".
Der Norm-Entwurf enthält eine Definition für den Begriff "Zerstörende Prüfung".
Keywords:
Components, Definitions, Destructive testing, Electrical engineering, Electronic engineering, Electronic equipment and components, Mechanical testing, Semiconductor devices, Terminology, Testing
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