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Normas BSI – AENOR
BS ISO 25498:2018 - TC

BS ISO 25498:2018 - TC

Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope

Fecha:
2020-02-27 /Definitive
Comité:
CII/9
Keywords:
Chemical analysis and testing, Electron diffraction, Spectroscopy, Test specimens, Microanalysis, Crystal lattices, Electron microscopes, Electron beams, Optical instruments
402,03
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