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Normas BSI – AENOR
BS ISO 18118:2015 - TC

BS ISO 18118:2015 - TC

Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Fecha:
2020-02-26 /Under Review
Comité:
CII/60
Keywords:
Chemical analysis and testing, Sensitivity, Experimental data, Quantitative analysis, Auger electron spectroscopy, Surface chemistry, Homogeneity, Electron emission, Spectroscopy, X-ray photoelectron spectroscopy, Chemical composition, Photoelectron spectroscopy
309,64
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