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Normas BSI – AENOR
BS EN IEC 60749-17:2019 - TC

BS EN IEC 60749-17:2019 - TC

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation

2020-02-24 /Definitive
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
  1. updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
  2. addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.
Irradiation, Electronic equipment and components, Destructive testing, Climate, Neutrons, Military equipment, Integrated circuits, Military engineering, Dosimeters, Radiation measurement, Environmental testing, Mechanical testing, Nuclear particles, Space technology components, Degradation, Semiconductor devices
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