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Normas BSI – AENOR
BS EN IEC 60749-17:2019 - TC

BS EN IEC 60749-17:2019 - TC

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation

Fecha:
2020-02-24 /Definitive
Comité:
EPL/47
Resumen:
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
  1. updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
  2. addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.
Keywords:
Irradiation, Electronic equipment and components, Destructive testing, Climate, Neutrons, Military equipment, Integrated circuits, Military engineering, Dosimeters, Radiation measurement, Environmental testing, Mechanical testing, Nuclear particles, Space technology components, Degradation, Semiconductor devices
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