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Normas BSI – AENOR
20/30406230 DC

20/30406230 DC

BS IEC 63275-1. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Part 1. Test method for bias temperature instability

Fecha:
2020-04-01 /Definitive
Comité:
EPL/47
Equivalencias internacionales:

47/2622/CD

Keywords:
Semiconductor technology, Semiconductor devices, Semiconductors, Diode transistor logic circuits, Transistor transistor logic circuits
23,24
Idioma Formato

Formato digital

Nota: Precios sin IVA ni gastos de envío

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