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Normas BSI – AENOR
PD IEC/TR 63133:2017

PD IEC/TR 63133:2017

Semiconductor devices. Scan based ageing level estimation for semiconductor devices

Fecha:
2018-01-29 /Definitive
Comité:
EPL/47
Equivalencias internacionales:

IEC TR 63133:2017

Resumen:
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
Keywords:
Electronic equipment and components, Storage, Performance, Estimation, Semiconductor devices
156,18
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