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Normas BSI – AENOR
BS IEC 62899-503-1:2020

BS IEC 62899-503-1:2020

Printed electronics. Quality assessment. Test method of displacement current measurement for printed thin-film transistor

Fecha:
2020-09-25 /Definitive
Comité:
AMT/9
Equivalencias internacionales:

IEC 62899-503-1:2020

Resumen:
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
Keywords:
LED, Test equipment, Electronic devices, Electronic equipment and components, Testing
143,39
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