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Normas BSI – AENOR
BS EN ISO 18452:2016

BS EN ISO 18452:2016

Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of thickness of ceramic films by contact-probe profilometer

Fecha:
2016-04-30 /Under Review
Comité:
RPI/13
Equivalencias internacionales:

EN ISO 18452:2016

ISO 18452:2005

Relación con otras normas BSI:

Reemplaza a: BS EN 1071-1:2003

Resumen:
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
Keywords:
Profile measurement, Profilometers, Thickness measurement, Special ceramics, Coatings, Ceramic coatings, Ceramics
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