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Normas BSI – AENOR
BS EN 61189-3-719:2016

BS EN 61189-3-719:2016

Test methods for electrical materials, printed boards and other interconnection structures and assemblies. Test methods for interconnection structures (printed boards). Monitoring of single plated-through hole (PTH) resistance change during temperature cycling

Fecha:
2016-04-30 /Definitive
Comité:
EPL/501
Equivalencias internacionales:

EN 61189-3-719:2016

IEC 61189-3-719:2016

Resumen:

This part of IEC 61189 specifies a test method to monitor the resistance of single plated-through holes (PTHs) in printed circuit boards (PCBs) to determine the PTH durability under thermo-mechanical stress induced by temperature cycling.

Keywords:
Electronic equipment and components, Peeling tests, Electrical testing, Visual inspection (testing), Solderability testing, Dimensional measurement, Thermal testing, Printed-circuit boards, Environmental testing, Accuracy, Mechanical testing, Reports, Precision, Fire tests, Printed circuits, Electrical insulating materials
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