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Normas BSI – AENOR
BS EN 62435-2:2017

BS EN 62435-2:2017

Electronic components. Long-term storage of electronic semiconductor devices. Deterioration mechanisms

Fecha:
2017-07-06 /Definitive
Comité:
EPL/47
Equivalencias internacionales:

EN 62435-2:2017

IEC 62435-2:2017

Resumen:
IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

Keywords:
Labels, Graphic symbols, Marking, Storage, Sensitivity, Electrostatics, Electrical testing, Electrical measurement, Endurance testing, Acceptance (approval), Reliability, Testing conditions, Measurement, Colour codes, Identification methods, Position, Electric terminals, Ratings, Symbols, Letters (symbols), Terminology, Electronic equipment and components, Integrating circuits, Semiconductor devices
200,75
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