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Normas BSI – AENOR
BS EN 60749-43:2017

BS EN 60749-43:2017

Semiconductor devices - Mechanical and climatic test methods. Guidelines for IC reliability qualification plans

Fecha:
2017-09-22 /Definitive
Comité:
EPL/47
Equivalencias internacionales:

EN 60749-43:2017

IEC 60749-43:2017

Resumen:
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
Keywords:
Reliability, Climatic protection, Mechanical classifiers, Semiconductor materials, Semiconductor technology
237,06
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