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Normas BSI – AENOR
BS EN 62132-1:2016

BS EN 62132-1:2016

Integrated circuits. Measurement of electromagnetic immunity. General conditions and definitions

Fecha:
2016-03-31 /Definitive
Comité:
EPL/47
Equivalencias internacionales:

EN 62132-1:2016

IEC 62132-1:2015

Relación con otras normas BSI:

Reemplaza a: BS EN 62132-1:2006

Resumen:
IEC 62132-1:2015 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 1 GHz has been deleted from the title;
b) frequency step above 1 GHz has been added in Table 2 in 7.4.1;
c) IC performance classes in 8.3 have been modified;
d) Table A.1 was divided into two tables, and references to IEC 62132-8 and IEC 62132-9 have been added in the new Table A.2 in Annex A.
Keywords:
Integrated circuits, Electrical measurement, Test equipment, Testing conditions, Electromagnetic radiation, Electrical wave measurement, Electronic equipment and components, Electromagnetic compatibility
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