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Normas BSI – AENOR
BS ISO 17862:2013

BS ISO 17862:2013

Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers

Fecha:
2013-12-31 /Under Review
Comité:
CII/60
Equivalencias internacionales:

ISO 17862:2013

Keywords:
Chemical analysis and testing, Secondary, Calibration, Ions, Surfaces, Control samples, Mass spectrometers, Surface chemistry, Mass spectrometry
234,32
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