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Normas BSI – AENOR
BS ISO 16531:2013

BS ISO 16531:2013

Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

Fecha Anulación:
2020-10-06 /Withdrawn
Comité:
CII/60
Equivalencias internacionales:

ISO 16531:2013

Relación con otras normas BSI:

Reemplazada por: BS ISO 16531:2020

Keywords:
Surfaces, Surface chemistry, Optical measurement, Chemical composition, Glow discharges, Quantitative analysis, Spectroscopy, Chemical analysis and testing, Thickness, Mass
200,62
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Formato digital

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