Saltar navegación principal
Normas BSI – AENOR
BS EN 61788-17:2013

BS EN 61788-17:2013

Superconductivity. Electronic characteristic measurements. Local critical current density and its distribution in large-area superconducting films

Fecha:
2013-04-30 /Revision Underway
Comité:
L/-/90
Equivalencias internacionales:

EN 61788-17:2013

IEC 61788-17:2013

Resumen:
IEC 61788-17:2013 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are from 200 A/m to 32 kA/m, with a measurement resolution of 100 A/m.
Keywords:
Data transmission methods, Transport layer (OSI), Open systems interconnection, Interfaces (data processing), Data transfer, Electricity supply meters, Electrical equipment, Test equipment, Copper, Reports, Current measurement, Superconductors, Electric current, Electrical conductivity, Electrical resistivity, Direct current, Reliability, Electrical properties of materials, Titanium, Electric fields, Testing conditions, Error correction, Composite materials, Specimen preparation, Superconductivity, Niobium, Magnetic field effects, Mathematical calculations
264,72
Idioma Formato

Formato digital

Nota: Precios sin IVA ni gastos de envío

Añadir a la cesta