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Normas BSI – AENOR
BS EN 60749-29:2011

BS EN 60749-29:2011

Semiconductor devices. Mechanical and climatic test methods. Latch-up test

2011-08-31 /Definitive
Equivalencias internacionales:

EN 60749-29:2011

IEC 60749-29:2011

Relación con otras normas BSI:

Reemplaza a: BS EN 60749-29:2003

IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:
- a number of minor technical changes;
- the addition of two new annexes covering the testing of special pins and temperature calculations.
Climate, Electrical testing, Overvoltage, Destructive testing, Failure rate, Environmental testing, Overvoltage tests, Mechanical testing, Electronic equipment and components, Integrated circuits, Semiconductor devices, Electrical faults, Electrical impedance
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