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Normas BSI – AENOR
BS EN 60749-29:2011

BS EN 60749-29:2011

Semiconductor devices. Mechanical and climatic test methods. Latch-up test

Fecha:
2011-08-31 /Definitive
Comité:
EPL/47
Equivalencias internacionales:

EN 60749-29:2011

IEC 60749-29:2011

Relación con otras normas BSI:

Reemplaza a: BS EN 60749-29:2003

Resumen:
IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:
- a number of minor technical changes;
- the addition of two new annexes covering the testing of special pins and temperature calculations.
Keywords:
Climate, Electrical testing, Overvoltage, Destructive testing, Failure rate, Environmental testing, Overvoltage tests, Mechanical testing, Electronic equipment and components, Integrated circuits, Semiconductor devices, Electrical faults, Electrical impedance
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