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Normas BSI – AENOR
BS ISO 13424:2013

BS ISO 13424:2013

Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis

Fecha:
2013-10-31 /Under Review
Comité:
CII/60
Equivalencias internacionales:

ISO 13424:2013

Keywords:
Spectroscopy, Photoelectron spectroscopy, X-ray analysis, Chemical analysis and testing, X-ray photoelectron spectroscopy
286,6
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