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Normas BSI – AENOR
BS ISO 17331:2004+A1:2010

BS ISO 17331:2004+A1:2010

Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

Fecha:
2010-09-30 /Definitive
Comité:
CII/60
Equivalencias internacionales:

ISO 17331:2004/AMD 1:2010

Keywords:
Chemical analysis and testing, Surface chemistry, Silicon, Iron, X-ray fluorescence spectrometry, Control samples, Decomposition reactions, Fluorimetry, Spectrophotometry, Substrates (insulating), Nickel, Spectroscopy
205,5
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