BS EN 62415:2010

Semiconductor devices. Constant current electromigration test

Información:

Fecha:

2010-07-31 /Definitive

ICS:

31.080.01 - Semiconductor devices in general

Comité:

EPL/47

Equivalencias internacionales:

EN 62415:2010

IEC 62415:2010

Resumen:

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

Keywords:

Constant, Electrical measurement, Electrons, Semiconductors, Transistors, Electronic equipment and components, Ions, Semiconductor devices, Electric current

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