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Normas BSI – AENOR
BS EN 62415:2010

BS EN 62415:2010

Semiconductor devices. Constant current electromigration test

Fecha:
2010-07-31 /Definitive
Comité:
EPL/47
Equivalencias internacionales:

EN 62415:2010

IEC 62415:2010

Resumen:
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Keywords:
Constant, Electrical measurement, Electrons, Semiconductors, Transistors, Electronic equipment and components, Ions, Semiconductor devices, Electric current
124,02
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