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Normas BSI – AENOR
BS IEC 62528:2007

BS IEC 62528:2007

Standard testability method for embedded core-based integrated circuits

Fecha:
2007-12-31 /Confirmed
Comité:
EPL/501
Equivalencias internacionales:

IEC 62528:2007

Resumen:
Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.
Keywords:
Testing, Electronic engineering, Computer circuits, Microprocessor chips, Electronic equipment and components, Computer hardware, Integrated circuits
363,63
Idioma Formato

Formato digital

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