BS IEC 62528:2007

Standard testability method for embedded core-based integrated circuits

Información:

Fecha:

2007-12-31 /Confirmed

ICS:

31.200 - Integrated circuits. Microelectronics

Comité:

EPL/501

Equivalencias internacionales:

IEC 62528:2007

Resumen:

Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.

Keywords:

Testing, Electronic engineering, Computer circuits, Microprocessor chips, Electronic equipment and components, Computer hardware, Integrated circuits

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