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Normas BSI – AENOR
BS EN 60068-2-82:2007

BS EN 60068-2-82:2007

Environmental testing. Tests. Test Tx. Whisker test methods for electronic and electric components

Fecha Anulación:
2019-07-12 /Withdrawn
Comité:
EPL/501
Equivalencias internacionales:

EN 60068-2-82:2007

IEC 60068-2-82:2007

Relación con otras normas BSI:

Reemplazada por: BS EN IEC 60068-2-82:2019

Resumen:
IEC 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress. This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable. The contents of the corrigendum of December 2009 have been included in this copy.
Keywords:
Printed-circuit boards, Elongation, Crystal growth, Tin, Surface defects, Electrical equipment, Finishes, Solders, Electronic equipment and components, Environmental testing, Testing conditions, Test equipment, Tin alloys, Electrical components, Dimensional changes
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