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Normas BSI – AENOR
BS EN 61164:2004

BS EN 61164:2004

Reliability growth. Statistical test and estimation methods

Fecha:
2004-09-02 /Definitive
Comité:
DS/1
Equivalencias internacionales:

EN 61164:2004

IEC 61164:2004

Relación con otras normas BSI:

Reemplaza a: BS 5760-17:1995

Resumen:
IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.

This publication is to be read in conjunction with IEC 61014:2003.
Keywords:
Statistical testing, Statistical methods of analysis, Statistical quality control, Estimation, Failure (quality control), Reliability, Mathematical calculations, Quality, Confidence limits, Quality control, Mathematical models, Formulae (mathematics)
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