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Normas BSI – AENOR
BS EN 60749-24:2004

BS EN 60749-24:2004

Semiconductor devices. Mechanical and climatic test methods. Accelerated moisture resistance. Unbiased HAST

2004-06-24 /Definitive
Equivalencias internacionales:

EN 60749-24:2004

IEC 60749-24:2004

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
Solid-state physics, Accelerated testing, Mechanical testing, Semiconductor devices, Accelerated corrosion tests, Moisture measurement, Climate, Temperature, Humidity, Performance testing, Corrosion resistance, Destructive testing, Electronic equipment and components, Damp-heat tests, Reliability, Environmental testing, Integrated circuits, Testing conditions
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