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Normas BSI – AENOR
BS EN 60749-9:2002

BS EN 60749-9:2002

Semiconductor devices. Mechanical and climatic test methods. Permanence of marking

Fecha Anulación:
2017-11-27 /Withdrawn
Comité:
EPL/47
Equivalencias internacionales:

EN 60749-9 (IEC 60749-9:2002) AS

IEC 60749-9:2002

Relación con otras normas BSI:

Reemplazada por: BS EN 60749-9:2017

Reemplaza a: BS EN 60749:1999

Resumen:
Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.
Keywords:
Mechanical testing, Environmental testing, Non-destructive testing, Marking, Integrated circuits, Permanent, Semiconductor devices, Chemical-resistance tests, Electronic equipment and components, Climate, Solvent-resistance tests
120,44
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