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Normas BSI – AENOR
BS EN 60749-6:2002

BS EN 60749-6:2002

Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature

Fecha Anulación:
2017-11-24 /Withdrawn
Comité:
EPL/47
Equivalencias internacionales:

EN 60749-6:2002

IEC 60749-6:2002

Relación con otras normas BSI:

Reemplazada por: BS EN 60749-6:2017

Reemplaza a: BS EN 60749:1999

Resumen:
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.
Keywords:
Integrated circuits, Semiconductor devices, Semiconductor storage, Mechanical testing, Climate, Electronic equipment and components, Electronic storage, Environmental testing, High temperatures
120,99
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