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Normas BSI – AENOR
PD IEC/PAS 62277:2002, IEC/PAS 62277:2001

PD IEC/PAS 62277:2002, IEC/PAS 62277:2001

Test-fixture of surface mounting quartz crystal units

Fecha Anulación:
2003-11-19 /Withdrawn
Comité:
EPL/49
Equivalencias internacionales:

IEC PAS 62277:2001

Relación con otras normas BSI:

Reemplazada por: BS EN 60444-8:2003

Resumen:
Describes the test-fixture that allows the accurate measurement of resonance frequency, resonance resistance, and electrical-equivalent-circuit constants of a leadless surface mounting quartz crystal using the zero phase technique as specified in IEC 60444.
Keywords:
Calibration, Piezoelectric devices, Circuits, Electrical equipment, Frequencies, Dielectric devices, Electronic equipment and components, Crystals (electronic), Crystal resonators, Electrical properties and phenomena
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