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Normas BSI – AENOR
DD ISO/TR 15969:2001

DD ISO/TR 15969:2001

Surface chemical analysis. Depth profiling. Measurement of sputtered depth

Fecha Anulación:
2021-03-26 /Withdrawn
Comité:
CII/60
Equivalencias internacionales:

ISO/TR 15969:2001

Relación con otras normas BSI:

Reemplazada por: PD ISO/TR 15969:2021

Keywords:
Chemical analysis and testing, Electron emission, Spectroscopy, Spectrochemical analysis, Surface properties, Depth, Dimensional measurement, Surface chemistry, Radiation measurement, X-rays, Profile measurement, Mass spectrometry, Control samples
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