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Normas BSI – AENOR
BS EN 60747-5-3:2001

BS EN 60747-5-3:2001

Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods

Fecha:
2003-01-20 /Under Review
Comité:
EPL/47
Equivalencias internacionales:

EN 60747-5-3:2001

IEC 60747-5-3:1997/AMD1:2002

Relación con otras normas BSI:

Reemplazada por: BS EN 60747-5-5:2011+A1:2015

Keywords:
Photometers, Electronic equipment and components, Light-sensitized materials, Phototransistors, Light-emitting devices, Intensity, Emission, Voltage, Luminosity, Light emission, Optoelectronic devices, Integrated circuits, Semiconductor devices, Measuring instruments, Radiation
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