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Normas BSI – AENOR
BS ISO 14606:2000

BS ISO 14606:2000

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

Fecha Anulación:
2015-12-31 /Withdrawn
Comité:
CII/60
Equivalencias internacionales:

ISO 14606:2000

Relación con otras normas BSI:

Reemplazada por: BS ISO 14606:2015

Keywords:
Augers, Depth, Electron emission, Microscopic analysis, Control samples, Surface chemistry, Chemical analysis and testing, Laminates, Profile measurement, Mass spectrometry, Spectroscopy, Reference conditions, X-rays, Surface properties, Spectrochemical analysis, Radiation measurement
200,54
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