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Normas BSI – AENOR
BS 6493-1.1:1984, IEC 60747-1:1983

BS 6493-1.1:1984, IEC 60747-1:1983

Semiconductor devices. Discrete devices. General

Fecha Anulación:
2006-06-30 /Withdrawn
Comité:
EPL/47
Equivalencias internacionales:

IEC 60747-1:1983

Relación con otras normas BSI:

Reemplazada por: BS IEC 60747-1:2006+A1:2010

Keywords:
Electrostatics, Electrical testing, Letters (symbols), Colour codes, Sensitivity, Acceptance (approval), Selection, Grades (quality), Reliability, Test duration, Numerical designations, Position, Graphic symbols, Electric terminals, Definitions, Measurement, Semiconductor devices, Electrical measurement, Labels, Marking, Electronic equipment and components, Standardized parameters, Symbols, Storage, Endurance testing, Testing conditions, Ratings
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