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Normas BSI – AENOR
BS EN 60512-6-2:2002

BS EN 60512-6-2:2002

Connectors for electronic equipment. Tests and measurements. Dynamic stress tests. Test 6b. Bump

Fecha:
2002-06-05 /Definitive
Comité:
EPL/48/-/2
Equivalencias internacionales:

EN 60512-6-2:2002

IEC 60512-6-2:2002

Resumen:
Defines a standard test method to assess the ability of components (essentially connectors) to withstand specified severities of bump.
Keywords:
Electromechanical devices, Dynamic testing, Electric connectors, Mechanical testing, Measurement, Stress, Bump tests, Electronic equipment and components, Electrical equipment, Electrical components, Testing
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