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Normas BSI – AENOR
BS EN 12544-2:2000

BS EN 12544-2:2000

Non-destructive testing. Measurement and evaluation of the X-ray tube voltage. Constancy check by the thick filter method

Fecha Anulación:
2020-03-19 /Withdrawn
Comité:
WEE/46
Equivalencias internacionales:

EN 12544-2:2000

Relación con otras normas BSI:

Reemplazada por: BS EN ISO 16526-1:2020

Reemplazada por: BS EN ISO 16526-2:2020

Resumen:
This standard specifies a constancy check of a X-ray system where mainly the X-ray voltage is checked and also the tube current and the constitution of the target which can be changing due to ageing of the tube. The thick filter method is based on a measurement of the dose rate behind a defined thick filter using defined distances between the X-ray tube, the filter and the measuring device. This method is very sensitive to changes of the voltage, but it does not provide an absolute value for the X-ray tube voltage.
Keywords:
Non-destructive testing, Voltage measurement, Filters, Constant-voltage sources, X-ray tubes, Radiographic testing, Voltage, X-ray apparatus
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