Saltar navegación principal
Normas BSI – AENOR
BS EN 12543-2:1999

BS EN 12543-2:1999

Non-destructive testing. Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing. Pinhole camera radiographic method

Fecha Anulación:
2008-07-31 /Withdrawn
Comité:
WEE/46
Equivalencias internacionales:

EN 12543-2:1999

Relación con otras normas BSI:

Reemplazada por: BS EN 12543-2:2008

Keywords:
Rated voltage, Non-destructive testing, Holes, Dimensional measurement, Pinholes, Resolution, Industrial, X-ray tubes, Dimensions, Cameras, Radiographic testing, Testing conditions, Radiography, Test equipment, Focal spots, X-ray apparatus, Electron tubes
130,54
Idioma Formato

Formato digital

Nota: Precios sin IVA ni gastos de envío

Añadir a la cesta